electron-diffraction instrument

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• Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… …   Wikipedia

• Low-energy electron diffraction — (LEED) is a technique used to characterize the structures of surfaces.History =Davisson and Germer s discovery of electron diffraction= The development of electron diffraction was closely linked to the progress of quantum mechanics and atomic… …   Wikipedia

• Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

• Electron — For other uses, see Electron (disambiguation). Electron Experiments with a Crookes tube first demonstrated the particle nature of electrons. In this illustration, the profile of the cross shaped target is projected against the tube face at right… …   Wikipedia

• Électron — Traduction à relire Electron → …   Wikipédia en Français

• Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …   Wikipedia

• Neutron diffraction — Science with Neutrons Foundations Neutron temperature Flux · Radiation  …   Wikipedia

• Low-energy electron microscopy — Low energy electron microscopy, or LEEM, is a technique used by surface scientists to study surface structure at mesoscopic scale on conducting and semiconducting materials. It is based on imaging the electrons elastically scattered from the… …   Wikipedia

• Powder diffraction — is a scientific technique using X ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [B.D. Cullity Elements of X ray Diffraction Addison Wesley Mass. 1978] Explanation Ideally …   Wikipedia

• Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… …   Wikipedia

• Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français